ESREF 2020, the 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis is moving from an in-person (physical) to a virtual (web based) event to be organized by the Univ. of Athens (UoA), IESL/FORTH and AUTH & HNA in Greece from October 4 to 8, 2020. This international symposium will continue its history of focusing on the latest research developments and future directions in failure analysis, quality and reliability of materials, devices and circuits for micro-, opto-, power and space electronics. It historically provides an unprecedented European forum to develop all aspects of reliability, including management and advanced analysis techniques for present- and emerging semiconductor applications. All aspects related to specification, technology and manufacturing, testing, control and analysis are addressed in ESREF.