Technical Program Committee
Technical Program Chairs
Francesco Iannuzzo, Univ. of Aalborg (DK)
Philomela Komninou, Aristotle Univ. of Thessaloniki (GR)
Nikos Melanitis, Hellenic Naval Academy (GR)
Spyros Gardelis, Univ. of Athens (GR)
Tracks in ESREF 2020
A - Quality and reliability assessment techniques and methods for devices and systems
- Ninoslav STOJADINOVIC - University of Nis, Serbia
- Edgar OLTHOF - NXP Semiconductors, Netherlands
B - Failure mechanisms and reliability of micro- and nanoelectronics
- Alain BRAVAIX - ISEN-Toulon, France
- Androula NASSIOPOULOU - INN/NCSR D, Greece
- Enrique MIRANDA - Universitat Autònoma de Barcelona, Spain
C - Progress in failure analysis: defect detection and analysis
- Ingrid DE WOLF - IMEC, Belgium
- Frank ALTMANN - Fraunhofer, Germany
D - Reliability of microwave devices and circuits
- Nathalie LABAT – IMS Bordeaux, France
- Michael DAMMANN - Fraunhofer IAF, Germany
E - Packaging and assembly reliability and failure analysis
- Paolo COVA - University of Parma, Italy
- Eckart HOENE - Fraunhofer IZM, Germany
F1 - Silicon power devices, IGBTs, thyristors
- Mauro CIAPPA – ETH Zurich, Switzerland
- Chiara CORVASCE - ABB Semiconductors , Switzerland
F2 - Wide-bandgap power devices
- Joachim WUERFL - Ferdinand-Braun-Institut, Germany
- Matteo MENEGHINI - University of Padova, Italy
- Loic THEOLIER – University of Bordeaux, France
F3 - Power electronic auxiliary circuits and system reliability
- Francesco IANNUZZO - Aalborg University, Denmark
- Hong LI - Beijing Jiaotong University, China
G - Optoelectronics, Micro-Electro-Mechanical actuators and MEMS
- Massimo VANZI - University of Cagliari, Italy
- Loukas MICHALAS - FORTH-HELLAS, Greece
H - ESD, EOS, Latch-up, EMC-EMI in integrated and power circuits
- Nicolas NOLHIER - LAAS, France
- Gianluca BOSELLI - Texas Instruments Inc, USA
I - Renewable energy systems reliability
- Haoze LUO - Zhejiang University, Hangzhou, China
J - Modeling for Reliability
- Susanna REGGIANI - University of Bologna, Italy
- Luca SPONTON - Synopsys, Switzerland
K - Radiation impact on circuits and systems reliability
- Simone GERARDIN - University of Padova, Italy
- Olivier CREPEL – Airbus, France
L – Batteries, capacitors & passives
- Francesco IANNUZZO - Aalborg University, Denmar
- Spyros GARDELIS - University of Athens, Greece
