KEYNOTE SPEAKERS
Prof. Aristos Christou
Materials Science and Engineering. Mechanical Engineering
Maryland Energy Innovation Institute'
Center for Risk and Reliability
"Reliability Limitations from Crystal Defects in Thick GaN Epitaxial Layers for Power Electronics"
Click here for Biography.
Click here for Summary.
Prof. Dr. Gabriel Aeppli
Head of Photon Science Division (PSD)
https://www.psi.ch/en/psd/people/gabriel-aeppli
"High-resolution non-destructive three-dimensional imaging of integrated circuits"
Click here for Summary.
Konstantinos Emmanouil
System Architect, More Electric Engine, Rolls-Royce Deutschland
"Reliability in the era of electrification in aviation: a systems approach"
Click here for Summary.
INVITED SPEAKERS
Dr. Alberto Castellazzi
Power Electronics, Power Semiconductor Devices, Packaging, Thermal Management
"Fail-to-open short-circuit failure mode in SiC power MOSFETs: device characterization and system level exploitation"
Click here for more information.
Click here for Summary.
Prof. Nicola Delmonte
Affiliation: University of Parma, Italy
https://www.unipr.it/ugov/person/15171
“3D and compact thermal modeling in power electronics: an overview”
Click here for Summary.
Prof. Martin Kuball,
School of Physics, Bristol University, UK
http://www.bristol.ac.uk/physics/people/martin-h-kuball/index.html
“Gallium Nitride on Diamond”
Click here for Summary.
Dr. Kornelius Tetzner
Ferdinand-Braun-Institut, Berlin FBH, Germany
https://www.fbh-berlin.de/en/
”Challenges to Overcome Breakdown Limitations in lateral β-Ga2O3 MOSFET Devices.”
Click here for Summary.
