|
|
|
Call for Papers
The 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), continues on the recent developments and future directions in Quality and Reliability of materials, devices and circuits for power-, micro-, nano-, down scaling reliability challenges and optoelectronics, passive components, PCBs, and, this year for the first time, batteries. ESREF provides an unequalized opportunity for networking at European and world levels, with several hundreds of participants every year from academia and industry.
CALL FOR PAPERS IS NOW CLOSED.
|
| Online user: 18 | Privacy |
|
